Jeol jsm 7500f manual

The JSMF features an optical system that includes a semi-in-lens type objective lens, which can collimate the electron beam even at low accelerating voltages. Like a true general-purpose SEM system, JSMF can provide high-resolution imaging of large specimensAccelerating voltage: kV to 30kV. JSMF. FIELD EMISSION SCANNING ELECTRON MICROSCOPE OPERATION GUIDE. For the proper use of the instrument, be sure to read this instruction manual. Even after you read it, please keep the manual on hand so that you can consult it whenever necessary. ISMF-OG NOV Printed in Japan. JEOL JSMF SEM SOP. UNT Cleanroom. 1. Sample preparation: Select proper sample holder. Adjust the screw on the bottom to have sample line up with the top edge of the holder (SEM use it as reference for Z). 2. Imaging operation: (1) Open the program and log in with your user name and password. Check SEM status under the Maintenance= GUN.

EDS and FTIR analyses were performed at the Cooperative Center for Research Facilities (CCRF) at Sungkyunkwan University, Korea, using JEOL JSMF (JEOL Ltd., Tokyo, Japan) and Bruker IFS/S and TENSOR27 (Bruker Co., Billerica, MA, USA), respectively. The surface morphologies and the microstructures of the samples were observed on a scanning electron microscopy (SEM, JEOL JSMF, Japan). Thermal gravimetric analysis was performed on a TG F1 Iris thermogravimetric analyzer (NETZSCH, Germany) from room temperature to °C with a heating rate of 10 °C min −1 −1. Tensile tests. 50%, 75%, and %). Platelet adhesion was observed using a SEM (JSMF, JEOL, Japan) operated at an accelerating voltage of 20 kV. Enzyme-linked immune sorbent assays (ELISA): The blood was centrifuged for 20 min at rpm (4 °C) to obtain plasma. Then the plasma was mixed with specific.

The jeol ithrlv field emission scanning electron microscope (fe-sem) is intended to enable imaging and characterization for in-situ micro-mechanical. A new scintillator backscattered electron detector (sbed) and a versatile backscattered electron detector (vbed) are also available with the jsm-it JSMF. FIELD EMISSION SCANNING ELECTRON MICROSCOPE OPERATION GUIDE. For the proper use of the instrument, be sure to read this instruction manual. Even after you read it, please keep the manual on hand so that you can consult it whenever necessary. ISMF-OG NOV Printed in Japan. be observed and analyzed at high magnification. The JSMF also enables researchers various analyses such as EDS, WDS, EBSD and CL. • nm (15 kV), nm (1 kV) to 30 kV. x25 to 1,, JSM.. F. Field Emission Scanning Electron Microscope. The JSMF. developed for nanostructure characterization. is equipped.